Measurement Data - Statistical Analysis of Total Ionizing Dose Effects on Random Telegraph Noise in 40 nm CMOS Ring Oscillators

This repository contains experimental measurement data acquired from CHIP4 of the SIRENS40 test chip. The dataset supports the statistical analysis of Random Telegraph Noise (RTN) behavior under Total Ionizing Dose (TID) stress as presented in the associated IEEE Transactions on Nuclear Science publication. The data consists of time-resolved oscillation frequency measurements from fully differential ring oscillators fabricated in a commercial 40 nm bulk CMOS technology and exposed to X-ray irradiation up to a cumulative dose of 100 Mrad(SiO2).