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Published in July 2021 | Version v1

Dissertation Open

Combining grazing incidence X-ray diffraction with computational methods for organic semiconductor structural analysis

Hofer, Sebastian (aut)

25000_6990_hofer_sebastian_2021.pdf

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Created: September 18, 2023 | Modified: May 27, 2025

Name: Hofer, Sebastian

Title: Combining grazing incidence X-ray diffraction with computational methods for organic semiconductor structural analysis

Resource Type: Dissertation

Published: July 2021

Language: eng