Grazing Incidence X-ray Diffraction Data of Anthraquinone, ZIF-8 and Binaphthalene Thin Films

Beschreibung

Technical info (English)

GIXD data was measured with X-rays at a wavelength of 1.4 A on a Dectris Pilatis 2M detector. ZIF-8 thin films were measured statically with a sample-detector distance of 150 mm. For the anthraquinone and binaphthalene samples, a sample-detector distance of 200 mm was used and samples were rotated around their surface normal during the measurements. For the transformation of the data to reciprocal space an LaB6 calibrant was measured. The corresponding files are also included in the data set.