Grazing Incidence X-ray Diffraction Data of Anthraquinone, ZIF-8 and Binaphthalene Thin Films
Description
This data set contains grazing incidence X-ray diffraction (GIXD) data of anthraquinone, ZIF-8 and binaphthalene thin films measured at the XRD1 beamline Elettra Trieste. Additionally, MATLAB code is provided to extract radial line profiles from measured GIXD data and to determine quantitative information by fitting of the measured radial line profiles using a simulated annealing algorithm.
Technical info (English)
GIXD data was measured with X-rays at a wavelength of 1.4 A on a Dectris Pilatis 2M detector. ZIF-8 thin films were measured statically with a sample-detector distance of 150 mm. For the anthraquinone and binaphthalene samples, a sample-detector distance of 200 mm was used and samples were rotated around their surface normal during the measurements. For the transformation of the data to reciprocal space an LaB6 calibrant was measured. The corresponding files are also included in the data set.
Files
GIXD_RawData.zip
Additional details
Funding
- FWF Austrian Science Fund
- 10.55776/P34463