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Veröffentlicht in July 2021 | Version v1

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Combining grazing incidence X-ray diffraction with computational methods for organic semiconductor structural analysis

Hofer, Sebastian (aut)

25000_6990_hofer_sebastian_2021.pdf

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Erstellt: 18. September 2023 | Bearbeitet: 27. Mai 2025

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Name: Hofer, Sebastian

Titel: Combining grazing incidence X-ray diffraction with computational methods for organic semiconductor structural analysis

Ressource-Typ: Dissertation

Veröffentlicht: July 2021

Sprache: eng